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Electronic test equipment
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#	Item
11	INQUIRY PHYSICS A Modified Learning Cycle Curriculum by Granger Meador Unit 15: Electrical Circuits Add to Reading List Source URL: www.bps-ok.org Language: English - Date: 2012-03-02 23:11:27 Electromagnetism Force Electricity Electronic test equipment Measuring instruments Electrical engineering Electrical systems Ammeter Multimeter Voltmeter Voltage Electrical element
12	Researcher Mobility Grant (RMG) APPLICATIONS ARE INVITED – Researcher in optical atomic clocks 2 RESEARCH: The RMG-Researcher may propose any activities that complement and add scientific value to the related JRP, whic Add to Reading List Source URL: msu.euramet.org Language: English - Date: 2016-06-29 08:27:41 Quantum optics Quantum mechanics Physics Atomic clock Electronic test equipment Atomic physics SI base units Metrology Clock Laser Kilogram Optical lattice
13	TUNING PROCEDURE FOR THE OM Power OM2500A Amplifier. Set the OPR/STBY switch to OPR Select TUNE in the multimeter. Start at bottom of band, i.e.: 14000 kHz on 20 m Reduce TXCVR power to 0W. Add to Reading List Source URL: www.arraysolutions.com Language: English - Date: 2016-06-09 19:42:30 Electromagnetism Electronics Receiver Electricity Electronic test equipment Measuring instruments Amplifier Tuner Multimeter Radio electronics Electronic tuner
14	ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International Journal Add to Reading List Source URL: www.ijmetmr.com Language: English - Date: 2015-01-19 08:03:14 Electromagnetism Electronic engineering Electronics Electronic circuits Digital circuits Electronic test equipment Oscillators Electronic design Prescaler Dual-modulus prescaler Frequency divider Frequency synthesizer
15	microHAM © 2015 All rights reserved SMΩRF RF VECTOR SIGNAL METER Add to Reading List Source URL: www.microham.com Language: English - Date: 2016-04-11 11:00:17 Measuring instruments Technology Electronics Transducers Electronic test equipment Sensor node Wireless sensor network Electromagnetism Sensor Oscilloscope
16	ANALITE NEP390 SERIES INTELLIGENT TURBIDITY PROBES WITH RS232 INTERFACE The ANALITE 390 series of microprocessor based turbidity probes are designed for monitoring and process applications where turbidity levels of up to Add to Reading List Source URL: www.anhydre.eu Language: English - Date: 2014-03-28 14:31:49 Electronic test equipment Measuring instruments
17	www.thinkSRS.com Measurements with the SR620 Application Note #2 In order to realize the full potential of the SR620 Universal Time Interval and Frequency Counter, a brief look at its Add to Reading List Source URL: www.thinksrs.com Language: English - Date: 2015-08-28 18:10:00 Electrical engineering Electromagnetism Electronics Oscillators Electronic test equipment Digital signal processing Measuring instruments Electronic circuits Frequency counter Jitter Allan variance Oscilloscope
18	MODEL SR830 DSP Lock-In Amplifier 1290-D Reamwood Avenue Sunnyvale, CaliforniaPhone: ( • Fax: ( Add to Reading List Source URL: www.thinksrs.com Language: English - Date: 2015-08-28 18:13:45 Electronic engineering Electronics Electronic circuits Electromagnetism Integrated circuits Electronic test equipment Laboratory equipment Amplifier Operational amplifier Analog-to-digital converter Power supply Lock-in amplifier
19	1 VI. Why Things Don’t Work – Why S/N Theory Often Seems to be Irrelevant There are many reasons why things don’t workIdiocy Add to Reading List Source URL: www-physics.lbl.gov Language: English - Date: 2012-06-20 20:16:25 Electromagnetism Electrical engineering Electronics Laboratory equipment Electronic test equipment Radio electronics Detectors Radio technology Amplifier Semiconductor detector Oscilloscope Input impedance
20	Ridgetop Group, IncWest Ina Road Tucson, AZUSA +www.RidgetopGroup.com Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2015-07-18 01:30:09 Electronic engineering Electronics manufacturing Electronics Technology IEEE standards Electronic test equipment JTAG Boundary scan Design for testing Automatic test equipment System on a chip Mentor Graphics